Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)

For Nano-Metric CMOS VLSI
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)
Medimops DE
187.98 EUR
Preis aktualisiert am: 11-08-2026 02:51:30
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
SpringerLink DE
236.00 EUR
Preis aktualisiert am: 10-08-2026 23:10:32
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Marke
Springer US
ISBN
Springer US 0387465464
MPN
Springer US 5860717

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