Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)

For Nano-Metric CMOS VLSI
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)
Medimops DE
187.98 EUR
Preis aktualisiert am: 05-05-2026 11:16:04
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
SpringerLink DE
213.99 EUR
Preis aktualisiert am: 05-05-2026 14:38:42
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Marke
Springer US
ISBN
Springer US 0387465464
MPN
Springer US 5860717

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