Defects in HIgh-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices (NATO Science Series II: Mathematics, Physics and Chemistry, 220, Band 216)

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Defects in HIgh-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices (NATO Science Series II: Mathematics, Physics and Chemistry, 220, Band 216)
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Defects in HIgh-k Gate Dielectric Stacks
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Marke
Evgeni Gusev
ISBN
Evgeni Gusev 9781402043659

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