Power-Constrained Testing of Vlsi Circuits: A Guide To The Ieee 1149.4 Test Standard (Frontiers in Electronic Testing, 22B)

Of VLSI Circuits
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Power-Constrained Testing of Vlsi Circuits: A Guide To The Ieee 1149.4 Test Standard (Frontiers in Electronic Testing, 22B)
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Nicola Nicolici
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Nicola Nicolici 1441953159

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