Electrical Characterization of Silicon-on-Insulator Materials and Devices (The Springer International Series in Engineering and Computer Science)

Ein tiefgehendes Werk über die Messung von Leitfähigkeit, Kapazität und Rauschverhalten in SOI‑Strukturen, das theoretische Grundlagen mit praxis ...
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Electrical Characterization of Silicon-on-Insulator Materials and Devices
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Sorin Cristoloveanu
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Sorin Cristoloveanu 1461359457
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Sorin Cristoloveanu biography

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