Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact (Springer Series in Materials Science, Band 270)

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Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact (Springer Series in Materials Science, Band 270)
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Metal Impurities in Silicon- and Germanium-Based Technologies, Fachbücher von Cor Claeys, Eddy Simoen
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181.89 EUR
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Metal Impurities in Silicon- and Germanium-Based Technologies
SpringerLink DE
201.00 EUR
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Marke
Cor Claeys
ISBN
Cor Claeys 3030067475

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