Optical Characterization of Thin Solid Films

Dieses Buch vermittelt praxisorientierte Einblicke in die optische Analyse dünner Festschichten, erklärt Interferometrie, Ellipsometrie und Spektros ...
Of Thin Solid Films
Wo zu kaufen (1) Eigenschaften
Gesponsert
Optical Characterization of Thin Solid Films
SpringerLink DE
201.00 EUR
Preis aktualisiert am: 07-09-2026 11:17:53
Siehe Produktangebot

Allgemein

Marke
Springer
ISBN
Springer 3030092003

Eigenschaften

Ähnliche Produkte

Optical Characterization of Plasmonic Nanostructures: Near-Field Imaging of the Magnetic Field of Light (Springer Theses)
Optical Characterization of Plasmonic Nanostructures: Near-Field Imaging of the Magnetic Field of Light (Springer Theses)
Produkt anzeigen
Design and Development of Optical Dispersion Characterization Systems (SpringerBriefs in Electrical and Computer Engineering)
Design and Development of Optical Dispersion Characterization Systems (SpringerBriefs in Electrical and Computer Engineering)
Produkt anzeigen
Optical Characterization of Epitaxial Semiconductor Layers
Optical Characterization of Epitaxial Semiconductor Layers
Produkt anzeigen
Optical Characterization of Thin Solid Films
Optical Characterization of Thin Solid Films
Produkt anzeigen
OCM 2017
OCM 2017 - Optical Characterization of Materials - conference proceedings
Produkt anzeigen
Characterization of CdxZn1-xS and PbS thin films for Photovoltaics
Characterization of CdxZn1-xS and PbS thin films for Photovoltaics
Produkt anzeigen
Menü