Microscopy of Semiconducting Materials: Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK (Springer Proceedings in Physics, 107, Band 107)

Microscopy of Semiconducting Materials
Wo zu kaufen (2) Eigenschaften
Gesponsert
Microscopy of Semiconducting Materials: Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK (Springer Proceedings in Physics, 107, Band 107)
Medimops DE
194.34 EUR
Preis aktualisiert am: 09-02-2026 20:58:24
Siehe Produktangebot
Gesponsert
Microscopy of Semiconducting Materials
SpringerLink DE
236.00 EUR
Preis aktualisiert am: 05-02-2026 01:43:18
Siehe Produktangebot

Allgemein

Marke
A.G. Cullis
ISBN
A.G. Cullis 354031914X
MPN
A.G. Cullis 489 illus.

Eigenschaften

Ähnliche Produkte

Microscopy of Semiconducting Materials: Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK (Springer Proceedings in Physics, 107, Band 107)
Microscopy of Semiconducting Materials: Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK (Springer Proceedings in Physics, 107, Band 107)
Produkt anzeigen
Microscopy of Semiconducting Materials 1983 Third Oxford Conference on Microscopy of Semiconducting Materials St Catherines College March 1983
Microscopy of Semiconducting Materials 1983 Third Oxford Conference on Microscopy of Semiconducting Materials St Catherines College March 1983
Produkt anzeigen
Microscopy of Semiconducting Materials 1987 Proceedings of the Institute of Physics Conference Oxford University April 1987
Microscopy of Semiconducting Materials 1987 Proceedings of the Institute of Physics Conference Oxford University April 1987
Produkt anzeigen
Microscopy of Semiconducting Materials: 1999 Proceedings of the Institute of Physics Conference held 22-25 March 1999, University of Oxford, UK (Institute of Physics Conference Series)
Microscopy of Semiconducting Materials: 1999 Proceedings of the Institute of Physics Conference held 22-25 March 1999, University of Oxford, UK (Institute of Physics Conference Series)
Produkt anzeigen
Microscopy of Semiconducting Materials
Microscopy of Semiconducting Materials
Produkt anzeigen
Microscopy of Semiconducting Materials 2007
Microscopy of Semiconducting Materials 2007
Produkt anzeigen
Menü