Nitrogen incorporation into high-k gate dielectrics

Ein Fachbuch, das die Rolle von Stickstoff in HfO₂‑ und HfSiO‑Gate‑Dielektriken beleuchtet, zeigt, wie dessen Einbindung die Stabilität, die ...

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Nitrogen incorporation into high-k gate dielectrics, Fachbücher

Galaxus.de

68.00 EUR

Preis aktualisiert am: 03-08-2026 08:23:37

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Allgemein

ISBN

3639157052

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