Ion beam Induced Modification of Semiconductor Nanocrystals: Ge and Si Nanocrystals

Ion beam Induced Modification
Wo zu kaufen (3) Eigenschaften
Gesponsert
Ion beam Induced Modification of Semiconductor Nanocrystals, Fachbücher von Saikiran Vadavalli
Galaxus.de
67.90 EUR
Preis aktualisiert am: 18-10-2026 14:02:50
Siehe Produktangebot
Gesponsert
Ion beam Induced Modification of Semiconductor Nanocrystals
Hugendubel
271.60 EUR
Preis aktualisiert am: 16-10-2026 11:36:39
Siehe Produktangebot
Gesponsert
Ion beam Induced Modification of Semiconductor Nanocrystals: Ge and Si Nanocrystals
Medimops DE
271.60 EUR
Preis aktualisiert am: 19-10-2026 06:03:29
Siehe Produktangebot

Allgemein

Marke
Saikiran Vadavalli
ISBN
Saikiran Vadavalli 3639668618

Eigenschaften

Ähnliche Produkte

Functional Nanostructures Fabricated by Focused Electron/Ion Beam Induced Deposition (Springer Theses)
Functional Nanostructures Fabricated by Focused Electron/Ion Beam Induced Deposition (Springer Theses)
Aus106.54 EUR 4
Produkt anzeigen
Functional Nanostructures Fabricated by Focused Electron/Ion Beam Induced Deposition (Springer Theses)
Functional Nanostructures Fabricated by Focused Electron/Ion Beam Induced Deposition (Springer Theses)
Aus99.99 EUR 3
Produkt anzeigen
High Resolution Focused Ion Beams: FIB and its Applications: The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology
High Resolution Focused Ion Beams: FIB and its Applications: The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology
Aus203.98 EUR 2
Produkt anzeigen
Ion Beam Induced Nanoscale Ripples on Si, TiO2 and Ti Surfaces
Ion Beam Induced Nanoscale Ripples on Si, TiO2 and Ti Surfaces
Aus54.90 EUR 2
Produkt anzeigen
Mohamed Ahmed, Ali Atta: The Induced Changes of Material Surfaces Due to Ion Beam Bombardment
Mohamed Ahmed, Ali Atta: The Induced Changes of Material Surfaces Due to Ion Beam Bombardment
Aus48.99 EUR 1
Produkt anzeigen
Exploration of Focused Ion Beam Processing
Exploration of Focused Ion Beam Processing
Aus59.00 EUR 1
Produkt anzeigen
Menü