Defects Spectroscopy in Silicon Diodes: Deep-level traps in semiconductors physics: from ultra-fast recovery to radiation-induced damage

Defects Spectroscopy in Silicon
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Defects Spectroscopy in Silicon Diodes: Deep-level traps in semiconductors physics: from ultra-fast recovery to radiation-induced damage
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68.74 EUR
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Defects Spectroscopy in Silicon Diodes, Fachbücher von Nicolò Barbero
Galaxus.de
69.90 EUR
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Nicolò Barbero
ISBN
Nicolò Barbero 9783639773040

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