Strategies to Reduce Power during VLSI Circuit Testing: Reduction of Dynamic and Leakage Power during Testing of Digital VLSI Circuits

Ein technisches Handbuch, das fortgeschrittene Ansätze zur Reduktion von dynamischer und Leckageleistung in VLSI-Testschaltungen präsentiert, mit pr ...
Power during VLSI Power during
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Strategies to Reduce Power during VLSI Circuit Testing
Hugendubel
196.00 EUR
Preis aktualisiert am: 26-09-2026 09:53:32
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Strategies to Reduce Power during VLSI Circuit Testing: Reduction of Dynamic and Leakage Power during Testing of Digital VLSI Circuits
Medimops DE
196.00 EUR
Preis aktualisiert am: 25-09-2026 08:19:05
Siehe Produktangebot

Allgemein

Marke
Subhadip Kundu
ISBN
Subhadip Kundu 3659255203

Eigenschaften

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