Strategies to Reduce Power during VLSI Circuit Testing: Reduction of Dynamic and Leakage Power during Testing of Digital VLSI Circuits

Ein technisches Handbuch, das fortgeschrittene Ansätze zur Reduktion von dynamischer und Leckageleistung in VLSI-Testschaltungen präsentiert, mit pr ...
Power during VLSI Power during
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Strategies to Reduce Power during VLSI Circuit Testing: Reduction of Dynamic and Leakage Power during Testing of Digital VLSI Circuits
Medimops DE
48.34 EUR
Preis aktualisiert am: 20-06-2026 02:22:38
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Strategies to Reduce Power during VLSI Circuit Testing, Fachbücher
Galaxus.de
49.00 EUR
Preis aktualisiert am: 25-06-2026 00:40:34
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Marke
Subhadip Kundu
ISBN
Subhadip Kundu 3659255203

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