Design for Yield and Reliability for Nanometer CMOS Digital Circuits

Ein praxisorientiertes Werk für Halbleiteringenieure, das statistische Entwurfsstrategien, Soft‑Error‑Analyse, adaptive Body‑Bias und negative ...
Design for Yield and
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Design for Yield and Reliability for Nanometer CMOS Digital Circuits, Fachbücher von Hassan Mostafa, Mohab Anis, Mohamed Elmasry
Galaxus.de
59.90 EUR
Preis aktualisiert am: 29-07-2026 01:33:55
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ISBN
365951361X

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