Single Electron Spin Measurements in Submicron Si MOS-FETs

Dieses Buch führt durch die Messung einzelner Elektronenspins in submikronen Silizium‑MOSFETs, beleuchtet zufällige Telegraphsignale und erklärt ...
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Single Electron Spin Measurements in Submicron Si MOS-FETs, Fachbücher von Ming Xiao
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59.00 EUR
Preis aktualisiert am: 23-05-2026 01:07:51
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3836493756

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