Device characterization of Dy-incorporated HfO2 gate oxide nMOS device: Device characteristics and reliability of DyO/HfO gate dielectrics and the application to NAND Flash memory

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Device characterization of Dy-incorporated HfO2 gate oxide nMOS device: Device characteristics and reliability of DyO/HfO gate dielectrics and the application to NAND Flash memory
Medimops DE
58.34 EUR
Preis aktualisiert am: 09-07-2026 21:50:04
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Device characterization of Dy-incorporated HfO2 gate oxide nMOS device, Fachbücher
Galaxus.de
59.00 EUR
Preis aktualisiert am: 03-08-2026 08:44:19
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LAP Lambert Academic Publishing

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