Single Event Upset in Dual- and Triple-Well SRAMs: Radiation-induced Charge Collection Mechanisms in sub-90nm Dual- and Triple-well CMOS SRAMs

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Single Event Upset in Dual- and Triple-Well SRAMs: Radiation-induced Charge Collection Mechanisms in sub-90nm Dual- and Triple-well CMOS SRAMs
Medimops DE
48.34 EUR
Preis aktualisiert am: 29-05-2026 14:51:10
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Single Event Upset in Dual- and Triple-Well SRAMs, Fachbücher von Indranil Chatterjee
Galaxus.de
49.00 EUR
Preis aktualisiert am: 29-05-2026 14:51:03
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Indranil Chatterjee
ISBN
Indranil Chatterjee 365912365X

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