Single Event Upsets in Sub-65nm CMOS technologies: Monte-Carlo simulations and contribution to understanding of physical mechanisms

Erforscht die Ursachen von Einzelereignis‑Upsets in Sub‑65 nm CMOS, indem es Monte‑Carlo‑Simulationen mit experimentellen Daten verknüpft u ...
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Single Event Upsets in Sub-65nm CMOS technologies, Fachbücher von Slawosz Uznanski
Galaxus.de
68.00 EUR
Preis aktualisiert am: 29-05-2026 15:37:26
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Slawosz Uznanski
ISBN
Slawosz Uznanski 3846595519

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