Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications (Springer Series in Advanced Microelectronics, 47, Band 47)

Ein umfassendes Werk, das die Zuverlässigkeit von Hochmobilitäts‑SiGe‑Kanals-MOSFETs analysiert und deren Auswirkungen auf kommende CMOS‑Techn ...
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Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications (Springer Series in Advanced Microelectronics, Band 47)
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Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
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Marke
Jacopo Franco
MPN
Jacopo Franco 219 black & white illustrations, biograp
ISBN
Jacopo Franco 9400776624

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