Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications

Reliability of High Mobility
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Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
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Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications, Fachbücher von Ben Kaczer, Jacopo Franco, Guido Groeseneken
Galaxus.de
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Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
SpringerLink DE
118.00 EUR
Preis aktualisiert am: 19-09-2026 18:47:55
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9402402055

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