Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications

Reliability of High Mobility
Wo zu kaufen (2) Eigenschaften
Gesponsert
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
SpringerLink DE
106.99 EUR
Preis aktualisiert am: 29-04-2026 10:34:39
Siehe Produktangebot
Gesponsert
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications, Fachbücher von Ben Kaczer, Jacopo Franco, Guido Groeseneken
Galaxus.de
106.99 EUR
Preis aktualisiert am: 28-04-2026 22:45:15
Siehe Produktangebot

Allgemein

ISBN
9402402055

Eigenschaften

Ähnliche Produkte

Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications (Springer Series in Advanced Microelectronics, 47, Band 47)
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications (Springer Series in Advanced Microelectronics, 47, Band 47)
Produkt anzeigen
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Produkt anzeigen
Reliability studies of GaN High Electron Mobility Transistors.
Reliability studies of GaN High Electron Mobility Transistors.
Produkt anzeigen
High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip
High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip
Produkt anzeigen
Reliability of Sub-Seabed Disposal Operations for High Level Waste
Reliability of Sub-Seabed Disposal Operations for High Level Waste
Produkt anzeigen
Vishnevsky, Vladimir M.: Reliability Assessment of Tethered High-altitude Unmanned Telecommunication Platforms
Vishnevsky, Vladimir M.: Reliability Assessment of Tethered High-altitude Unmanned Telecommunication Platforms
Produkt anzeigen
Menü