Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces

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Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces
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Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces
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96.49 EUR
Preis aktualisiert am: 10-11-2026 16:11:33
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Springer New York

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